AI-SEMI · CORE SYSTEM
97%Cost reduction
Vision-based inspection, defect classification and root-cause analysis close the yield learning loop.
CLOSED-LOOP WORKFLOW
From signal to decision—and back to the line.
Inspect
Capture inspection signals and detect defects.
Classify
Group defect patterns with AI classification.
Diagnose
Connect defects with likely process causes.
Compensate
Feed corrective actions back into manufacturing.
NEXT · AI-DRIVEN FAB